Influence of Various Widths of Patterned Fabrics on the Yield Factor of Cutting Layouts

Authors

  • Dragutin Sekelj Institute of Textile and Clothing, Faculty of Technology of the University of Zagreb, Zagreb, Croatia, Yugoslavia
  • Blaž Knez Institute of Textile and Clothing, Faculty of Technology of the University of Zagreb, Zagreb, Croatia, Yugoslavia

Abstract

This paper presents a study of the influence of various widths of patterned fabrics on the yield factor of cutting layouts. The investigation was carried out on 210 cutting layouts, in each of them being distributed the cuts of two sizes 7 - 50 for man‘s suit. The results obtained showed, that the span of the fabric width exerts an influence on the yield factor of cutting layouts. The difference of the value of the yield factor of cutting layouts on the fabric width 70 to 76 cm for the pattern 1 cm x 1 cm amounts to 1.44 %, for the pattern 3 cm x 3 cm 0.89 %, for the pattern 6 cm x 6 cm 1.35 %, for the pattern 8 cm x 8 cm 1.54 %, for the pattern 10 cm x 10 cm 1.68 %. By means of statistical methods, the linear interdependence of the yield factor of cutting layouts on the fabric width and the size of the pattern in the fabric was found out.

Published

1990-08-31

How to Cite

[1]
Sekelj, D. and Knez, B. 1990. Influence of Various Widths of Patterned Fabrics on the Yield Factor of Cutting Layouts. Tekstil. 39, 8 (Aug. 1990), 448–453.

Issue

Section

Original scientific paper

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